一種新型過流保護電路的設(shè)計研究
張娜娜 梁齊
（合肥工業(yè)大學， 安徽合肥230009）
摘要：本文提出的過流保護電路利用運算放大器虛短虛斷的原理大大提高了對輸出電流的采樣精度，從而提高了電路的可靠性；并通過增加的折回電路，有效降低了LDO（Low Drop-Out）系統(tǒng)的過流關(guān)斷功耗。本電路基于TSMC 0.6μ m CMOS 工藝設(shè)計，進行了應(yīng)用于LDO 的Spectra 仿真，結(jié)果表明該過流保護電路可靠性高、過流關(guān)斷功耗低。
關(guān)鍵字：過流保護，LDO，可靠性，折回電路
Design of a Novel Over-Current Protection Circuit
Zhang Nana , Liang Qi (Hefei University Of Technology , Hefei , Anhui 230009, China)
Abstract : The over-current protection circuit described in this paper greatly improves the
sampling precision of output current and heightens the reliability of the circuit by using the
virtual-short and virtual-cutoff principle of operation amplifier . And more , It greatly reduces the over-current cutoff power dissipation of LDO（Low Drop-Out）by using a fold-back circuit . Based on TSMC 0.6μ m CMOS process , the Spectra simulation result applied in LDO verifies that this over-current protection circuit has good reliability and low power dissipation .
Key words : over-current , LDO（Low Drop-Out）, reliability, fold-back circuit